| Photo | |
| Title | Four Point Probe |
| Purpose | 6" Wafer I-V Curve and Thin Film Surface Resistance Measurement |
| Service |
I-V curve and thin film surface resistance measurement |
| Brand | EVERBEING |
| Model | EB-6 |
| SPEC |
1. A 5½-digit digital power supply with 6½-digit multimeter functionality, output power of at least 20W, and built-in digital I/O, IEEE-488, and RS-232 interfaces. 2. DC measurement range: 3. DC output range: 4. Functions: Capable of measuring V, I, and Ω; supports 2/4/6-wire ohm measurement; programmable control of voltage/current and setting of protection levels; simultaneously obtains I-V (V-I) curve plots. |
| Sample & Fee |
On-campus Operated Fee ($/hr) – NT$300 Self-operation Fee ($/hr) – NT$200 |
| Reminder |
1. Samples must not contain moisture, be magnetic, or contain volatile substances. |
| Location | Red Building 1F, Shared Micro-Nano Technology Laboratory - Measurement Room |
| Update | 2019/04/23 |
| Lab | Micro-Nano Technology Shared Lab |
| Hashtags |
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