| Photo | |||||||||||
| Title | Scanning Electron Microscope | ||||||||||
| Purpose | 1. Observation of Surface Structure | ||||||||||
| Brand | HITACHI | ||||||||||
| Model | SU3800 | ||||||||||
| SPEC |
1. Resolution: SE 3.0 nm / BSE 4.0 nm / EDS 129 eV 2. Accelerating voltage range: 0.3–30 kV 3. Electron gun: Cold Field Emission Electron Gun |
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| Sample & Fee |
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| Reminder | The specimen must not be magnetic, volatile, or corrosive. | ||||||||||
| Location | 紅樓1F微奈米科技共用實驗室-無塵室 | ||||||||||
| Update | 2022/05/27 | ||||||||||
| Lab | Micro-Nano Technology Shared Lab | ||||||||||
| Hashtags |
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